Мақаланы E-mail арқылы жіберу Investigation of heterostructures based on hafnium oxide
- Авторлар: Sharifullina Y.I.1, Gumarova I.I.1,2, Mamin R.F.2, Nedopekin O.V.1
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Мекемелер:
- Kazan Federal University
- Zavoisky Physical-Technical Institute, FRC Kazan Scientific Center of the Russian Academy of Science
- Шығарылым: Том 87, № 4 (2023)
- Беттер: 580-586
- Бөлім: Articles
- URL: https://rjpbr.com/0367-6765/article/view/654439
- DOI: https://doi.org/10.31857/S0367676522701034
- EDN: https://elibrary.ru/MDCZEP
- ID: 654439
Дәйексөз келтіру
Ашық рұқсат
Рұқсат берілді
Рұқсат ақылы немесе тек жазылушылар үшін
Аннотация
We presented ab initio calculations of bulk structures and thin films of hafnium oxide, and heterostructures based on hafnium oxide in the tetragonal phase and silicon, structural and electronic properties are investigated. The density of states spectra is considered, the results obtained are analyzed, and some of them are compared with previously obtained data (for the studied systems).
Авторлар туралы
Y. Sharifullina
Kazan Federal University
Хат алмасуға жауапты Автор.
Email: janesharifullina@yandex.ru
Russia, 420008, Kazan
I. Gumarova
Kazan Federal University; Zavoisky Physical-Technical Institute, FRC Kazan Scientific Center of the Russian Academy of Science
Email: janesharifullina@yandex.ru
Russia, 420008, Kazan; Russia, 420029, Kazan
R. Mamin
Zavoisky Physical-Technical Institute, FRC Kazan Scientific Center of the Russian Academy of Science
Email: janesharifullina@yandex.ru
Russia, 420029, Kazan
O. Nedopekin
Kazan Federal University
Email: janesharifullina@yandex.ru
Russia, 420008, Kazan
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