Application of metal alkoxoacetylacetonates in preparation of electrochromic films based on nickel-doped V2O5

Capa

Citar

Texto integral

Acesso aberto Acesso aberto
Acesso é fechado Acesso está concedido
Acesso é fechado Acesso é pago ou somente para assinantes

Resumo

Vanadyl and nickel alkoxoacetylacetonates were used to prepare vanadium pentaoxide films doped with 1, 3, and 10 mol % nickel oxide. All films crystallized in tetragonal β-V2O5 modification. The materials are strongly textured along the (200) axis and formed from one-dimensional structures, however, at 3 and 10 mol % NiO content, nanoparticles of 30–50 nm size are also observed in addition to them. According to the results of Raman spectroscopy, the materials contain a noticeable amount of V4+ ions, but no traces of NiO phases were found. All obtained materials, in terms of electrochromic properties are cathodic, changing color during reduction to dark blue, and during oxidation — to more transparent yellow. At the same time, an increase in nickel content leads to a decrease in coloring efficiency and slowing down of electrochromic processes. The results of the study allow us to conclude that it is promising to use materials based on V2O5 doped with nickel, obtained with the use of metal alkoxoacetylacetonates as precursors, as components of electrochromic devices.

Texto integral

Acesso é fechado

Sobre autores

Ph. Gorobtsov

Kurnakov Institute of General and Inorganic Chemistry of the Russian Academy of Sciences

Autor responsável pela correspondência
Email: phigoros@gmail.com
Rússia, Moscow, 119991

N. Simonenko

Kurnakov Institute of General and Inorganic Chemistry of the Russian Academy of Sciences

Email: phigoros@gmail.com
Rússia, Moscow, 119991

T. Simonenko

Kurnakov Institute of General and Inorganic Chemistry of the Russian Academy of Sciences

Email: phigoros@gmail.com
Rússia, Moscow, 119991

E. Simonenko

Kurnakov Institute of General and Inorganic Chemistry of the Russian Academy of Sciences

Email: phigoros@gmail.com
Rússia, Moscow, 119991

Bibliografia

  1. Mortimer R.J. // Annu Rev. Mater. Res. 2011. V. 41. № 1. P. 241. https://doi.org/10.1146/annurev-matsci-062910-100344
  2. Avendaño E., Berggren L., Niklasson G.A. et al. // Thin Solid Films. 2006. V. 496. № 1. P. 30. https://doi.org/10.1016/j.tsf.2005.08.183
  3. Granqvist C.G., Arvizu M.A., Qu H.Y. et al. // Surf. Coat. Technol. 2019. V. 357. P. 619. https://doi.org/10.1016/j.surfcoat.2018.10.048
  4. Granqvist C.G. // Thin Solid Films. 2014. V. 564. P. 1. https://doi.org/10.1016/j.tsf.2014.02.002
  5. Gillaspie D.T., Tenent R.C., Dillon A.C. // J. Mater. Chem. 2010. V. 20. № 43. P. 9585. https://doi.org/10.1039/c0jm00604a
  6. Mortimer R.J., Dyer A.L., Reynolds J.R. // Displays. 2006. V. 27. № 1. P. 2. https://doi.org/10.1016/j.displa.2005.03.003
  7. Gu C., Jia A.B., Zhang Y.M. et al. // Chem. Rev. 2022. V. 122. № 18. P. 14679. https://doi.org/10.1021/acs.chemrev.1c01055
  8. Granqvist C.G., Arvizu M.A., Bayrak Pehlivan et al. // Electrochim Acta. 2018. V. 259. P. 1170. https://doi.org/10.1016/j.electacta.2017.11.169
  9. Zanarini S., Di Lupo F., Bedini A. et al. // J. Mater. Chem. C. Mater. 2014. V. 2. № 42. P. 8854. https://doi.org/10.1039/c4tc01123f
  10. Cheng K.C., Chen F.R., Kai J.J. // Solar Energy Materials Solar Cells. 2006. V. 90. № 7–8. P. 1156. https://doi.org/10.1016/j.solmat.2005.07.006
  11. Scherer M.R.J., Li L., Cunha P.M.S. et al. // Adv. Mat. 2012. V. 24. № 9. P. 1217. https://doi.org/10.1002/adma.201104272
  12. Jin A., Chen W., Zhu Q. et al. // Electr. Acta. 2010. V. 55. № 22. P. 6408. https://doi.org/10.1016/j.electacta.2010.06.047
  13. Costa C., Pinheiro C., Henriques I. et al. // ACS Appl. Mater. Interfaces. 2012. V. 4. № 10. P. 5266. https://doi.org/10.1021/am301213b
  14. Sonavane A.C., Inamdar A.I., Shinde P.S. et al. // J. Alloys. Compd. 2010. V. 489. № 2. P. 667. https://doi.org/10.1016/j.jallcom.2009.09.146
  15. Yoshino T., Kobayashi K., Araki S. et al. // Sol. Energy. Mater. Sol. Cells. 2012. V. 99. P. 43. https://doi.org/10.1016/j.solmat.2011.08.024
  16. Wen R.T., Niklasson G.A., Granqvist C.G. // ACS Appl. Mater. Interfaces. 2015. V. 7. № 18. P. 9319. https://doi.org/10.1021/acsami.5b01715
  17. Liu Q., Chen Q., Zhang Q. et al. // J. Mater. Chem. C Mater. 2018. V. 6. № 3. P. 646. https://doi.org/10.1039/c7tc04696k
  18. Chen Y., Wang Y., Sun P. et al. // J. Mate.r Chem. A Mater. 2015. V. 3. № 41. P. 20614. https://doi.org/10.1039/c5ta04011f
  19. Simonenko E.P., Simonenko N.P., Kopitsa G.P. et al. // Russ. J. Inorg. Chem. 2018. V. 63. P. 691. https://doi.org/10.1134/S0036023618060232
  20. Gorobtsov P.Y., Simonenko N.P., Simonenko T.L. et al. // Russ. J. Inorg. Chem. 2024. V. 69. P. 1580. https://doi.org/10.1134/S0036023624602277
  21. Горобцов Ф.Ю., Симоненко Н.П., Мокрушин А.С. и др. // Журн. неорган. химии. 2024. Т. 69. № 4. С. 624. https://doi.org/DOI: 10.31857/S0044457X24040177
  22. Filonenko V.P., Sundberg M., Werner P.E. et al. // Acta Crystallogr. B. 2004. V. 60. № 4. P. 375. https://doi.org/10.1107/S0108768104012881
  23. Talledo A., Valdivia H., Benndorf C. // J. Vac. Sci. Tech. 2003. V. 21. № 4. P. 1494. https://doi.org/10.1116/1.1586282
  24. Zou C., Fan L., Chen R. et al. // Cryst. Eng. Comm. 2012. V. 14. № 2. P. 626. https://doi.org/10.1039/c1ce06170d
  25. Khlayboonme S.T. // Results Phys. 2022. V. 42. P. 106000. https://doi.org/10.1016/j.rinp.2022.106000
  26. Khlayboonme S.T., Thedsakhulwong A. // Mater. Res. Express. 2022. V. 9. P. 076401. https://doi.org/10.1088/2053-1591/ac827a
  27. Asadov A., Mukhtar S., Gao W. // J. Vac. Sci. Tech. 2015. V. 33. P. 041802. https://doi.org/10.1116/1.4922628
  28. Ureña-Begara F., Crunteanu A., Raskin J.P. // Appl. Surf. Sci. 2017. V. 403. P. 717. https://doi.org/10.1016/j.apsusc.2017.01.160
  29. Shvets P., Dikaya O., Maksimova K. et al. // J. Raman Spectr. 2019. V. 50. № 8. P. 1226. https://doi.org/10.1002/jrs.5616
  30. Clauws P., Broeckx J., Vennik J. // Physica Status Solidi (B) 1985. V. 131. № 2. P. 459. https://doi.org/10.1002/pssb.2221310207
  31. Abello L., Husson E., Repelin Y. et al. // Spectrochim. Acta A. 1983. V. 39. P. 641.
  32. Zhou B., He D. // J. Raman Spectr. 2008. V. 39. № 10. P. 1475. https://doi.org/10.1002/jrs.2025
  33. Baddour-Hadjean R., Marzouk A., Pereira-Ramos J.P. // J. Raman Spectr. 2012. V. 43. № 1. P. 153. https://doi.org/10.1002/jrs.2984
  34. Schilbe P. // Physica. 2002. V. 316–317. P. 600.
  35. Ji Y., Zhang Y., Gao M. et al. // Sci. Rep. 2014. V. 4. P. 4854. https://doi.org/10.1038/srep04854
  36. Meyer J., Zilberberg K., Riedl T. et al. // J. Appl. Phys. 2011. V. 110. P. 033710. https://doi.org/10.1063/1.3611392
  37. Zhang H., Wang S., Sun X. et al. // J. Mater. Chem. C Mater. 2017. V. 5. № 4. P. 817. https://doi.org/10.1039/c6tc04050k
  38. Peng H., Sun W., Li Y. et al. // Nano. Res. 2016. V. 9. № 10. P. 2960. https://doi.org/10.1007/s12274-016-1181-z
  39. Mokrushin A.S., Simonenko T.L., Simonenko N.P. et al. // Appl. Surf. Sci. 2022. V. 578. P. 151984. https://doi.org/10.1016/j.apsusc.2021.151984
  40. Greiner M.T., Helander M.G., Wang Z.-B. et al. // J. Phys. Chem. C. 2010. V. 114. № 46. P. 19777. https://doi.org/10.1021/jp108281m

Arquivos suplementares

Arquivos suplementares
Ação
1. JATS XML
Baixar
2. Fig. 1. Diffraction patterns (a) and Raman spectra (b) of vanadium oxide films doped with different amounts of nickel on glass substrates after heat treatment at 400°C (2 h). The “*” marker marks reflections of the tetragonal modification β-V2O5.

Baixar (45KB)
Metadados
3. Fig. 2. Scanning electron microscopy results for the obtained vanadium oxide films with different nickel contents.

Baixar (68KB)
Metadados
4. Fig. 3. AFM results for vanadium oxide films with different nickel contents.

Baixar (32KB)
Metadados
5. Fig. 4. Results of measuring the electrochromic properties of V2O5 films with different nickel contents: a — transmission spectra of a cell with a V2O5–3% Ni sample in the visible and near IR ranges after holding for 60 s at different potential values; b — change in the transmittance of cells at a wavelength of 700 nm and holding for 15 s at 2 and –2 V (V2O5–1% Ni), –2.5 V (V2O5–3% Ni, V2O5–10% Ni); c — CVA of films recorded at a potential change rate of 50 mV/s.

Baixar (31KB)
Metadados

Declaração de direitos autorais © Russian Academy of Sciences, 2025