Informaçao sobre o Autor

Рогожин, А. Е.

Edição	Seção	Título	Arquivo
Volume 53, Nº 1 (2024)	TECHNOLOGIES	Interconnects Materials for Integrated Circuit Technology Below 5 Nm Node
Volume 52, Nº 5 (2023)	INSTRUMENTATION	Neuromorphic Systems: Devices, Architecture, and Algorithms
Volume 52, Nº 2 (2023)	ЛИТОГРАФИЯ	Cross Sections of Scattering Processes in Electron-Beam Lithography
Volume 52, Nº 2 (2023)	INSTRUMENTATION	Oxide Memristors for ReRAM: Approaches, Characteristics, and Structures
Volume 54, Nº 1 (2025)	MODELING	Calculation of distributions of electron beam energy absorbed in PMMA and Si using various scattering models
Volume 54, Nº 2 (2025)	NANOSTRUCTURES	Electrical characteristics of ruthenium lines with a cross-sectional area less than 1000 nm²
Volume 54, Nº 2 (2025)	INSTRUMENTATION	Ferroelectric transistors: operating principles, materials, applications
Volume 54, Nº 3 (2025)	DIAGNOSTICS	Structure of thin titanium nitride films deposited by magnetron sputtering