The peculiarities of magneto-optical spectra of NiFe-Ta bilayers

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Resumo

We presented the results of modeling the magneto-optical properties of nanoscale layered structures based on the permalloy-tantalum structure on a silicon substrate. The spectral dependences are calculated in the transverse geometry of the magneto-optical Kerr effect in the range of 0.5–4.0 eV, while a highly nonlinear behavior of the spectral dependences was established depending on the thickness of the permalloy and tantalum layer. It is also shown that the Kerr effect can be significantly enhanced with sufficiently large values of the thickness of the tantalum layer.

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Sobre autores

M. Yashin

MIREA – Russian Technological University; Bauman Moscow State Technical University

Email: alexey_yurasov@mail.ru
Rússia, Moscow, 119454; Moscow, 105005

A. Yurasov

MIREA – Russian Technological University

Autor responsável pela correspondência
Email: alexey_yurasov@mail.ru
Rússia, Moscow, 119454

M. Simdyanova

Lomonosov Moscow State University

Email: alexey_yurasov@mail.ru
Rússia, Moscow, 119991

I. Gladyshev

MIREA – Russian Technological University

Email: alexey_yurasov@mail.ru
Rússia, Moscow, 119454

T. Bakhvalova

MIREA – Russian Technological University

Email: alexey_yurasov@mail.ru
Rússia, Moscow, 119454

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2. Fig. 1. Model spectral dependences of the TKE of the layered structure NiFe – Ta/Si with different thicknesses of the Ta layer: from 1 to 5 nm (a); from 5 to 25 nm (b). The thickness of NiFe is 150 nm.

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3. Fig. 2. Model spectral dependences of the TKE of the layered structure NiFe – Ta/Si with different thicknesses of the Ta layer: from 4 to 8 nm (a); from 8 to 12 nm (b). The thickness of NiFe is 30 nm.

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4. Fig. 3. Model spectral dependences of the TKE of the layered structure NiFe – Ta/Si (solid line) at different thicknesses of the NiFe layer: from 5 to 30 nm (a); from 10 to 150 nm (b) in comparison with the experiment (dots). The thickness of Ta is 3 nm.

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5. Fig. 4. Spectral dependences of the TKE of the layered structure NiFe – Ta/Si with different thicknesses of the NiFe layer: from 5 to 30 nm (a); from 10 to 150 nm (b). The thickness of Ta is 10 nm.

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